INDUCTIVE LOAD TESTER (Included leakage current test)

LVNI20ZFCC is inductive load tester for MOS-FET, which system is for a measurement with a wafer condition. This system is equipped with high speed interception circuits at
a chip destruction, and has IGSS and IDSS measurement
circuits for leakage measurement before and after L load

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※Please call between 9 a.m. and 5 p.m. on weekdays