SEMICONDUCTOR TEST SYSTEM / INDUCTIVE LOAD TESTER
【MOS-FET, IGBT, DIODE】
This system can carry out DC and inductive load test at
measurement unit of overhead mechanism in cosideration
of wafer measurement with prober by continuance.
It has hish-sppeed power supply break function by the
protection circuit in head box at unusual waveform detection with inductive load test.
![](https://www.cats-world.jp/wp-cms/wp-content/uploads/2022/03/CHT2020ZC_LVNJ20ZFCA-1024x632.jpg)
Contact by phone click here.
+81-186-35-2102
※Please call between 9 a.m. and 5 p.m. on weekdays