SEMICONDUCTOR TEST SYSTEM / INDUCTIVE LOAD TESTER
【MOS-FET, IGBT, DIODE】
This system can carry out DC and inductive load test at
measurement unit of overhead mechanism in cosideration
of wafer measurement with prober by continuance.
It has hish-sppeed power supply break function by the
protection circuit in head box at unusual waveform detection with inductive load test.
Contact by phone click here.
※Please call between 9 a.m. and 5 p.m. on weekdays