SEMICONDUCTOR TEST SYSTEM /
SWITCHING TIME TEST SYSTEM
【TRANSISTOR, MOS-FET, DIODE】
CHT3050Z/SWL1050Z has been designed to evaluate a wafer which is able to measure DC and switching characteristics at once. This system is equipped with a press control unit to control by measurement program.
An oscilloscope for checking waveforms is built in and users can check it at any time.
Contact by phone click here.
※Please call between 9 a.m. and 5 p.m. on weekdays