SEMICONDUCTOR TEST SYSTEM
【MOS-FET, IGBT, THYRISTOR, DIODE, ZENER DIODE】
CHTDV3010ZZ has forcing ability of 3000V/1000A for DC measurement, 300A for thermal resistance measurement, which is better forcing ability than CHTDV1030Z.
This tester has the scanner function of 30 pins to measure multi-element device.
Contact by phone click here.
※Please call between 9 a.m. and 5 p.m. on weekdays