SEMICONDUCTOR TEST SYSTEM
【MOS-FET, IGBT, DIODE, THYRISTOR, ZENER DIODE】
CHTS3050Z is DC test system for measuring MOS-FET, IGBT and diode as well as thyristor and zener diode. The external units are arranged with 12 pin programmable scanners and high current sources, and the system configuration is designed with production facilities in mind.
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