SEMICONDUCTOR TEST SYSTEM / INDUCTIVE LOAD TESTER
【MOS-FET, IGBT, DIODE】
This system provides DC and L load measurements in succession using a measuring section with an overhead mechanism taking into account the prober measurement. In case of abnormal waveform detection in L load measurements, a protection circuit in the Head Box
is equipped with a fast power cut-off function.
![](https://www.cats-world.jp/wp-cms/wp-content/uploads/2022/03/CHT2060ZA_SLV560ZA-1024x724.jpg)
Contact by phone click here.
+81-186-35-2102
※Please call between 9 a.m. and 5 p.m. on weekdays