SEMICONDUCTOR TEST SYSTEM / INDUCTIVE LOAD TESTER
【MOS-FET, IGBT, DIODE】
This system provides DC and L load measurements in succession using a measuring section with an overhead mechanism taking into account the prober measurement. In case of abnormal waveform detection in L load measurements, a protection circuit in the Head Box
is equipped with a fast power cut-off function.
Contact by phone click here.
※Please call between 9 a.m. and 5 p.m. on weekdays